Invention Grant
- Patent Title: Test apparatus and control method thereof
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Application No.: US15361134Application Date: 2016-11-25
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Publication No.: US10228383B2Publication Date: 2019-03-12
- Inventor: Yeong Bae Yeo , Sil Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2016-0014593 20160205
- Main IPC: A61B5/00
- IPC: A61B5/00 ; G01N21/01 ; G01N21/25 ; G01N21/78 ; G01N33/49 ; G01N35/00 ; G01K11/16 ; G01N21/75 ; A61B5/15 ; G01N21/64 ; A61B5/026

Abstract:
A test apparatus for measuring the temperature of a reactor using a thermochromic pigment, and a method for controlling the test apparatus are disclosed, based on a technology for irradiating light of different wavelengths on a thermochromic pigment accommodated in a reactor and estimating temperature of the reactor using a difference between absorbance values corresponding to the light of the different wavelengths. The test apparatus includes at least one light emitter configured to irradiate light of different wavelengths onto a chamber included in the reactor, a light receiver configured to receive the light that propagates through the chamber, and a controller configured to measure absorbance values of the thermochromic pigment in correspondence to the different wavelengths of the light, to calculate a difference between the measured absorbance values, and to determine a temperature of the reactor in correspondence to the calculated difference between the absorbance values.
Public/Granted literature
- US20170227407A1 TEST APPARATUS AND CONTROL METHOD THEREOF Public/Granted day:2017-08-10
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