Invention Grant
- Patent Title: Apparatus and method for resonance magneto-optical defect center material pulsed mode referencing
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Application No.: US15468289Application Date: 2017-03-24
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Publication No.: US10228429B2Publication Date: 2019-03-12
- Inventor: Gregory Scott Bruce , Arul Manickam , Peter G. Kaup
- Applicant: Lockheed Martin Corporation
- Applicant Address: US MD Bethesda
- Assignee: LOCKHEED MARTIN CORPORATION
- Current Assignee: LOCKHEED MARTIN CORPORATION
- Current Assignee Address: US MD Bethesda
- Agency: Foley & Lardner LLP
- Main IPC: G01R33/26
- IPC: G01R33/26 ; G01R33/032

Abstract:
The present disclosure relates to apparatuses and methods for stimulating a magneto-optical defect material with defect centers in a magnetic detection system using a stimulation process to significantly increase magnetic sensitivity of the detection system. The system utilizes a modified Ramsey pulse sequence pair or a shifted magnetometry adapted cancellation (SMAC) pair to detect and measure the magnetic field acting on the system resulting in mitigation of low-frequency noise sources to provide improved sensor sensitivity. For a SMAC pair measurement, two different values of tau are used as well as two different values of the microwave pulse width.
Public/Granted literature
- US20180275221A1 APPARATUS AND METHOD FOR RESONANCE MAGNETO-OPTICAL DEFECT CENTER MATERIAL PULSED MODE REFERENCING Public/Granted day:2018-09-27
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