Invention Grant
- Patent Title: Structured illuminating microscopy and structured illuminating observation method
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Application No.: US15362125Application Date: 2016-11-28
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Publication No.: US10228552B2Publication Date: 2019-03-12
- Inventor: Tatsushi Nomura , Hisao Osawa , Naoki Fukutake
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2011-103652 20110506
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/14 ; G01N21/64

Abstract:
In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.
Public/Granted literature
- US20170276922A1 STRUCTURED ILLUMINATING MICROSCOPY AND STRUCTURED ILLUMINATING OBSERVATION METHOD Public/Granted day:2017-09-28
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