Invention Grant
- Patent Title: Memory circuit for reading ferroeletric memory having gain element including feedback capacitor
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Application No.: US14747679Application Date: 2015-06-23
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Publication No.: US10229726B2Publication Date: 2019-03-12
- Inventor: David Eric Schwartz , Tse Nga Ng , Ping Mei
- Applicant: Palo Alto Research Center Incorporated
- Applicant Address: US CA Palo Alto
- Assignee: Palo Alto Research Center Incorporated
- Current Assignee: Palo Alto Research Center Incorporated
- Current Assignee Address: US CA Palo Alto
- Agency: Miller Nash Graham and Dunn
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
A memory circuit has a ferroelectric memory cell having a word line and a bit line, an input transistor connected to the bit line, a gain element electrically connected the bit line, wherein the gain element includes a feedback capacitor, and an output terminal. A method of reading a memory cell includes applying a voltage to a word line of the memory cell, causing charge to transfer from the memory cell to a feedback capacitor, generating a voltage, amplifying the voltage by applying a gain having a magnitude of less than three, sensing an output voltage at an output node to determine a state of the memory cell, and storing the memory state in a latch.
Public/Granted literature
- US20160379703A1 CIRCUIT FOR READING FERROELECTRIC MEMORY Public/Granted day:2016-12-29
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