Invention Grant
- Patent Title: Detection of dependent failures
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Application No.: US15240544Application Date: 2016-08-18
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Publication No.: US10229805B2Publication Date: 2019-03-12
- Inventor: Thomas Zettler , Kirk Herfurth
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Potashnik, LLC
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01T1/00 ; G01K13/00 ; G01R29/08 ; H01H71/12 ; H01H35/00 ; H01H83/00 ; G01R31/28 ; G01N27/22
Abstract:
Devices and methods are provided which facilitate detecting of a disturbance parameter being outside a predetermined range. Such disturbance parameter may for example cause dependent failures in redundant circuits, for example redundant circuits being arranged on a same substrate.
Public/Granted literature
- US20160365213A1 Detection of Dependent Failures Public/Granted day:2016-12-15
Information query
