Invention Grant
- Patent Title: Semiconductor device having schottky electrode connected to anode region
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Application No.: US15170188Application Date: 2016-06-01
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Publication No.: US10229970B2Publication Date: 2019-03-12
- Inventor: Eri Ogawa , Akio Nakagawa
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kawasaki
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kawasaki
- Priority: JP2015-141832 20150716
- Main IPC: H01L29/861
- IPC: H01L29/861 ; H01L29/06 ; H01L29/40

Abstract:
For enhancing a reverse-recovery immunity of a diode element, a semiconductor device includes a first conductivity-type drift layer, a second conductivity-type anode region provided in an upper portion of the drift layer, an insulating film provided on the drift layer, an anode electrode having an ohmic contact portion ohmically contacted to the anode region through a contact hole penetrating the insulating film, and a Schottky electrode Schottky-contacted to a peripheral portion of the anode region.
Public/Granted literature
- US10199454B2 Semiconductor device having schottky electrode connected to anode region Public/Granted day:2019-02-05
Information query
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