Various embodiments are directed to a yarn analyzer comprising a measurement mechanism configured to monitor the local thickness of the yarn moving along a yarn path. The measurement mechanism comprises a fixed member and a displaceable member between which the yarn path passes. The displaceable member is secured relative to a mechanical amplifier comprising a pivotable lever arm at a first end of the pivotable lever arm at a short distance from the pivot axis of the lever arm, and is biased toward the fixed member. The measurement mechanism further comprises a displacement sensor configured to monitor the displacement of a reference component secured relative to a second end of the lever arm at a long distance from the pivot axis. The monitored movement of the reference component is correlated with the thickness of the yarn, such that the yarn thickness is recorded for the length of yarn.