Invention Grant
- Patent Title: Method and system for determining the position of a radiation source
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Application No.: US15643344Application Date: 2017-07-06
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Publication No.: US10234282B2Publication Date: 2019-03-19
- Inventor: Aimo Winkelmann , Stefano Vespucci
- Applicant: Bruker Nano GmbH , University of Strathclyde
- Applicant Address: DE Berlin GB Glasgow
- Assignee: Brunker Nano GmbH,University of Strathclyde
- Current Assignee: Brunker Nano GmbH,University of Strathclyde
- Current Assignee Address: DE Berlin GB Glasgow
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: EP16178468 20160707
- Main IPC: G01N23/203
- IPC: G01N23/203 ; G01B15/00 ; G01T1/29

Abstract:
The present invention refers to a method for determining a position of a divergent radiation source (1), comprising Irradiating a pixel detector (2) with a predetermined intensity distribution of radiation with wavelength λ originated from the radiation source (1), wherein the pixel detector (2) comprises a plurality of pixels with pixel coordinates (xi, yi, zi); Detecting, for each of the plurality of pixels, an intensity of the incident radiation (10); Determining, for each of the plurality of pixels, an incidence direction of the incident radiation using information on an orientation of an internal periodic structure at the pixel and the predetermined intensity distribution, wavelength λ and the detected intensity; and Determining the position (xp, yp, zp) of the radiation source (1) using the pixel coordinates (xi, yi, zi) and the incidence direction for each of the plurality of pixels. The invention further refers to a system, a computer-related product and a sample (8) for performing such method and to the use of a pixel detector (2) for determining a position of a divergent radiation source (1).
Public/Granted literature
- US10197393B2 Method and system for determining the position of a radiation source Public/Granted day:2019-02-05
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