Invention Grant
- Patent Title: Precision inclinometer with parallel dipole line trap system
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Application No.: US15198183Application Date: 2016-06-30
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Publication No.: US10234286B2Publication Date: 2019-03-19
- Inventor: Oki Gunawan
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Michael J. Chang, LLC
- Agent Vazken Alexanian
- Main IPC: G01C9/06
- IPC: G01C9/06 ; G06T7/00

Abstract:
Inclinometers with a parallel dipole line (PDL) trap system are provided. In one aspect, an inclinometer includes: a PDL trap having a pair of dipole line magnets, a transparent tube in between the dipole line magnets, and a diamagnetic object within the transparent tube, wherein the diamagnetic object is levitating in between the dipole line magnets; and a sensing system for determining a position z of the diamagnetic object in the PDL trap and for determining an inclination angle θ using the position z of the diamagnetic object in the PDL trap. Techniques to detect the diamagnetic object position using optical, capacitive and manual methods are described. A method for determining an inclination angle θ using the present inclinometers is also provided.
Public/Granted literature
- US20180003495A1 Precision Inclinometer with Parallel Dipole Line Trap System Public/Granted day:2018-01-04
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