Invention Grant
- Patent Title: System for determining abnormality in a monitored area
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Application No.: US15553351Application Date: 2016-02-05
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Publication No.: US10234388B2Publication Date: 2019-03-19
- Inventor: Hiromichi Ebata , Atsushi Mammoto
- Applicant: HOCHIKI CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HOCHIKI CORPORATION
- Current Assignee: HOCHIKI CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Shumaker, Loop & Kendrick, LLP
- Priority: JP2015-035635 20150225
- International Application: PCT/JP2016/053562 WO 20160205
- International Announcement: WO2016/136434 WO 20160901
- Main IPC: G01N21/53
- IPC: G01N21/53 ; G01N21/61 ; G08B17/10 ; G08B21/14 ; G08B29/18 ; G01N27/416 ; G08B17/107 ; G08B17/117

Abstract:
A system including a first information acquisition unit configured to acquire first information indicating a detection value of a first physical quantity in a monitored area, a second information acquisition unit configured to acquire second information indicating a detection value of a second physical quantity different from the first physical quantity, in the monitored area, and a determination unit configured to determine whether an abnormality has occurred in the monitored area, based on the detection value of the first physical quantity indicated by the first information, the detection value of the second physical quantity indicated by the second information, a first coefficient corresponding to the detection value of the first physical quantity and the detection value of the second physical quantity, and a first threshold.
Public/Granted literature
- US20180073982A1 SYSTEM FOR DETERMINING ABNORMALITY IN A MONITORED AREA Public/Granted day:2018-03-15
Information query
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