Invention Grant
- Patent Title: Method for inspecting an article and apparatus for measuring the article by multi-photon excitation technique
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Application No.: US15407354Application Date: 2017-01-17
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Publication No.: US10234389B2Publication Date: 2019-03-19
- Inventor: Wang-Yang Li , Ming-Che Chan , Hsiang-Ning Chen
- Applicant: CM VISUAL TECHNOLOGY CORPORATION
- Applicant Address: TW Tainan
- Assignee: CM VISUAL TECHNOLOGY CORPORATION
- Current Assignee: CM VISUAL TECHNOLOGY CORPORATION
- Current Assignee Address: TW Tainan
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/00

Abstract:
A method for inspecting an article containing a target material is provided. A sampling position of the article is illuminated by a beam of laser light having a wavelength λ. Illumination focus to a focal point at the sampling position of the article to produce molecular excitation of the target material by simultaneous absorption of n incident photons of the beam of laser light, wherein n is equal to or greater than two. An output light exited from the article is analyzed by a detector, wherein the output light is of a wavelength range between 0.8λ and 1.2λ.
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