Invention Grant
- Patent Title: Automated test equipment for testing a device under test and method for testing a device under test
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Application No.: US15051479Application Date: 2016-02-23
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Publication No.: US10234498B2Publication Date: 2019-03-19
- Inventor: Jonas Horst , Heinz Nuessle , Bernd Laquai
- Applicant: Jonas Horst , Heinz Nuessle , Bernd Laquai
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3183 ; G01R31/319 ; G06F11/273
Abstract:
An automated test equipment for testing a device under test includes a control unit and a plurality of tester subunits. The control unit is configured to put the tester subunits in a state of lower activity in dependence on a current demand on the test resources.
Public/Granted literature
- US20160169962A1 Automated Test Equipment for Testing a Device Under Test and Method for Testing a Device Under Test Public/Granted day:2016-06-16
Information query
