Invention Grant
- Patent Title: Image quality assessment using adaptive non-overlapping mean estimation
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Application No.: US15368132Application Date: 2016-12-02
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Publication No.: US10235608B2Publication Date: 2019-03-19
- Inventor: Setu Chokshi , Venkadachalam Ramalingam
- Applicant: The Nielsen Company (US), LLC
- Applicant Address: US NY New York
- Assignee: The Nielsen Company (US), LLC
- Current Assignee: The Nielsen Company (US), LLC
- Current Assignee Address: US NY New York
- Agency: Hanley, Flight & Zimmerman, LLC
- Priority: IN4238/DEL/2015 20151222
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/11 ; G06K9/46 ; G06K9/03

Abstract:
Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to assess image quality using adaptive non-overlapping mean estimation are disclosed. Example image quality assessment methods disclosed herein include replacing respective blocks of pixels of a first image with mean values of the respective blocks of pixels to determine a second image having a smaller size than the first image. Disclosed example image quality assessment methods also include determining a vector of features for the second image. Disclosed example image quality assessment methods further include applying the vector of features to a neural network, and classifying a quality of the first image based on an output of the neural network.
Public/Granted literature
- US20170177979A1 IMAGE QUALITY ASSESSMENT USING ADAPTIVE NON-OVERLAPPING MEAN ESTIMATION Public/Granted day:2017-06-22
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