Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15692798Application Date: 2017-08-31
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Publication No.: US10236339B2Publication Date: 2019-03-19
- Inventor: Shinya Kyogoku , Ryosuke Iijima , Keiko Ariyoshi
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2016-183918 20160921
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/36 ; H01L23/48 ; H01L21/22 ; H01L21/38 ; H01L23/482 ; H01L23/485 ; H01L23/532 ; H01L29/423 ; H01L29/739

Abstract:
According to one embodiment, a semiconductor device includes first to sixth semiconductor regions, a first electrode, and a first insulating film. The first semiconductor region includes first and second partial regions. The second semiconductor region is separated from the first partial region in a second direction crossing a first direction. The third semiconductor region is provided between the first partial region and the second semiconductor region. The fourth semiconductor region is provided between the first partial region and the third semiconductor region. The first electrode is separated from the second partial region, the second and third semiconductor regions, and a portion of the fourth semiconductor region. The first insulating film contacts the third semiconductor region. The fifth semiconductor region is provided between the first insulating film and the second partial region. The sixth semiconductor region is provided between the first insulating film and the fifth semiconductor region.
Public/Granted literature
- US20180083094A1 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2018-03-22
Information query
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