Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
-
Application No.: US15439232Application Date: 2017-02-22
-
Publication No.: US10236341B2Publication Date: 2019-03-19
- Inventor: Teruyuki Ohashi , Tatsuo Shimizu
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2016-134056 20160706
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/10 ; H01L29/16 ; H01L29/66 ; H01L29/78 ; H01L21/04

Abstract:
According to one embodiment, a semiconductor device includes first to fourth semiconductor regions, first and second electrodes, and a first insulating film. The first semiconductor region includes first and second partial regions, and an intermediate partial region. The first electrode is separated from the first partial region. The second electrode includes first and second conductive regions. The second semiconductor region is provided between the first conductive region and the first electrode. The third semiconductor region is provided between the first conductive region and at least a portion of the second semiconductor region. The fourth semiconductor region includes third and fourth partial regions. The fourth partial region is positioned between the first conductive region and the first electrode. The first insulating film is provided, between the fourth partial region and the first electrode, and between the second semiconductor region and the first electrode.
Public/Granted literature
- US20180012956A1 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2018-01-11
Information query
IPC分类: