Invention Grant
- Patent Title: Method for manufacturing a semiconductor device
-
Application No.: US15725717Application Date: 2017-10-05
-
Publication No.: US10236352B2Publication Date: 2019-03-19
- Inventor: Robert Haase , Martin Vielemeyer
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L29/66 ; H01L29/78 ; H01L29/51

Abstract:
A method for manufacturing a semiconductor device includes: providing a semiconductor substrate having a first side; forming a trench in the semiconductor substrate, the trench having a bottom and a sidewall extending from the bottom to the first side of the semiconductor substrate; forming an insulation structure including at least a first insulation layer and a second insulation layer on the sidewall and the bottom of the trench; forming a lower conductive structure in the lower portion of the trench; removing the second insulation layer in an upper portion of the trench while leaving the second insulation layer at least partially in a lower portion of the trench; and forming an upper conductive structure in the upper portion of the trench.
Public/Granted literature
- US20180151676A1 Method for Manufacturing a Semiconductor Device Public/Granted day:2018-05-31
Information query
IPC分类: