Invention Grant
- Patent Title: Circuit apparatus and electronic appliance
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Application No.: US14864114Application Date: 2015-09-24
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Publication No.: US10236679B2Publication Date: 2019-03-19
- Inventor: Atsushi Yamada , Katsumi Inoue
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2014-204506 20141003
- Main IPC: H02H5/04
- IPC: H02H5/04 ; H02H3/05

Abstract:
With an IC including a driver that drives a large current, its characteristics may be deteriorated or the IC may be broken by heat generated by the large current. By providing a plurality of sensors and disposing some of the sensors so as to be close to an output driver that flows a large current, which is a source of heat generation, an increase in the temperature of the IC can be rapidly detected, and the deterioration of the characteristics of the IC can be prevented by accurately actuating an overheating protection function based on a result of detection. Alternatively, breakage of the IC can be prevented by suppressing overheating.
Public/Granted literature
- US20160099560A1 CIRCUIT APPARATUS AND ELECTRONIC APPLIANCE Public/Granted day:2016-04-07
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