A SBS-standard test tube rack is provided which is suitable for use in automated capping and de-capping of flat bottomed test tubes, in particular flat bottomed glass vials, both for individual test tube capping and de-capping as well as simultaneous capping and de-capping of all test tubes in the aforementioned SBS-standard test tube rack. The rack comprises a top tier having a plurality of apertures and a bottom tier that comprises a friction tier of high friction material. The bottom of each well in the rack is formed of the high friction material.