Invention Grant
- Patent Title: Measuring apparatus and measuring method
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Application No.: US15545478Application Date: 2016-01-22
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Publication No.: US10240917B2Publication Date: 2019-03-26
- Inventor: Tomoya Yamada , Taku Matsudera
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: Kyocera Corporation
- Current Assignee: Kyocera Corporation
- Current Assignee Address: JP Kyoto
- Agency: Procopio Cory Hargreaves and Savitch LLP
- Priority: JP2015-011238 20150123
- International Application: PCT/JP2016/051882 WO 20160122
- International Announcement: WO2016/117691 WO 20160728
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G01N21/47 ; B07C5/342 ; G01N21/95

Abstract:
A measuring apparatus according to the present disclosure includes a support plate and an optical sensor. The support plate has an upper surface on a central portion of which an object is to be mounted, and is rotatable about an axis of rotation extending vertically from the central portion. The optical sensor is disposed above the support plate, and has a light-emitting element configured to irradiate the object with light and a light-receiving element configured to receive reflection light reflected from the object.
Public/Granted literature
- US20180010908A1 MEASURING APPARATUS AND MEASURING METHOD Public/Granted day:2018-01-11
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