A measurement apparatus includes an illumination unit configured to illuminate a measurement object with use of a plurality of point light sources configured to emit light based on illumination images modulated according to periodic functions out of phase with one another, an imaging unit configured to image the measurement object illuminated based on the illumination images, a first calculation unit configured to calculate phase information of a change in a luminance value at each of pixels based on a plurality of images captured by the imaging unit, and a first acquisition unit configured to acquire, from the phase information, a maximum reflection direction where a reflection direction is maximized on the measurement object.