Invention Grant
- Patent Title: Antifog property evaluating apparatus and antifog property evaluating method
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Application No.: US15341150Application Date: 2016-11-02
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Publication No.: US10241001B2Publication Date: 2019-03-26
- Inventor: Shinichi Kamei , Makoto Uchiumi , Yuichiro Higo
- Applicant: KYOWA INTERFACE SCIENCE CO., LTD.
- Applicant Address: JP Niiza, Saitama
- Assignee: KYOWA INTERFACE SCIENCE CO., LTD.
- Current Assignee: KYOWA INTERFACE SCIENCE CO., LTD.
- Current Assignee Address: JP Niiza, Saitama
- Agency: Flynn Thiel, P.C.
- Priority: JP2015-216697 20151104
- Main IPC: G01M11/02
- IPC: G01M11/02 ; G01N25/66 ; G02B1/18 ; G02B7/02 ; G06T7/00 ; G02B27/00

Abstract:
There are provided an antifog property evaluating apparatus and an antifog property evaluating method capable of quantitatively and objectively evaluating an antifog property in a more realistic situation. The antifog property evaluating apparatus includes: fogging generation devices configured to generate the fogging of a surface of a sample; an object disposed at a position different from that of the sample; an imaging device configured to image the object via the sample; and an evaluation device configured to evaluate the antifog property of the sample on the basis of object images acquired by imaging the object.
Public/Granted literature
- US20170122836A1 ANTIFOG PROPERTY EVALUATING APPARATUS AND ANTIFOG PROPERTY EVALUATING METHOD Public/Granted day:2017-05-04
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