Invention Grant
- Patent Title: Measuring device and measuring method
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Application No.: US15324160Application Date: 2015-07-01
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Publication No.: US10241031B2Publication Date: 2019-03-26
- Inventor: Makoto Katsura
- Applicant: OSAKA UNIVERSITY
- Applicant Address: JP Osaka
- Assignee: OSAKA UNIVERSITY
- Current Assignee: OSAKA UNIVERSITY
- Current Assignee Address: JP Osaka
- Agency: Studebaker & Brackett PC
- Priority: JP2014-140698 20140708
- International Application: PCT/JP2015/069026 WO 20150701
- International Announcement: WO2016/006515 WO 20160114
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01R19/00 ; G01B9/02 ; G01J3/28 ; G02B6/28 ; G02F1/35 ; G02F1/37 ; G01D3/02

Abstract:
A measuring device (1) includes a first signal generation section (3) and a first removal section (5). The first signal generation section (3) generates a first source signal (x1(t)) including a fundamental and a plurality of harmonics based on a first physical quantity (p1) and a second physical quantity (p2). The first removal section (5) removes some or all of the harmonics from the first source signal (x1(t)). The first source signal (x1(t)) is a periodic signal, and one period of the first source signal (x1(t)) includes a first signal (p1), a second signal (p2), and a reference signal (pr). The first signal (p1) has a first duration (w1) and indicates the first physical quantity (p1). The second signal (p2) has a second duration (w2) and indicates the second physical quantity (p2). The reference signal (pr) has a third duration (w3) and indicates the reference physical quantity (pr).
Public/Granted literature
- US20170160190A1 MEASURING DEVICE AND MEASURING METHOD Public/Granted day:2017-06-08
Information query