Invention Grant
- Patent Title: Concentration measuring method
-
Application No.: US15506440Application Date: 2015-08-24
-
Publication No.: US10241034B2Publication Date: 2019-03-26
- Inventor: Shigetoshi Sugawa , Rihito Kuroda
- Applicant: TOHOKU UNIVERSITY
- Applicant Address: JP Sendai, Miyagi
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai, Miyagi
- Agency: Venable LLP
- Priority: JP2014-176575 20140829; WOPCT/JP2015/055076 20150223
- International Application: PCT/JP2015/073675 WO 20150824
- International Announcement: WO2016/031750 WO 20160303
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N21/31 ; G01N21/03 ; G01N21/3504 ; A61B5/145 ; A61B5/1455 ; G01N21/35 ; G01N21/15 ; A61B5/00 ; A61B5/11 ; A61B5/1477

Abstract:
A concentration measurement method accurately, quickly, and non-destructively measures the concentration of a predetermined chemical component within an object to a nano-order trace concentration level in real time. A time sharing method irradiates the object light of a first wavelength and light of a second wavelength having different light absorption rates with respect to the object to be measured. Light of both wavelengths that arrives optically through the object is received by a shared light reception sensor, and signals respectively relating to light of the first and second wavelengths are output from the light reception sensor in accordance with the received light. A differential signal of these signals is formed, and the concentration of a chemical component in the object to be measured is derived on the basis of the differential signal.
Public/Granted literature
- US20170254746A1 CONCENTRATION MEASURING METHOD Public/Granted day:2017-09-07
Information query