Invention Grant
- Patent Title: Non-destructive inspection device and method
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Application No.: US15910706Application Date: 2018-03-02
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Publication No.: US10241061B2Publication Date: 2019-03-26
- Inventor: Yoshie Otake , Yoshimasa Ikeda
- Applicant: RIKEN
- Applicant Address: JP Saitama
- Assignee: RIKEN
- Current Assignee: RIKEN
- Current Assignee Address: JP Saitama
- Agency: Volpe and Koenig, P.C.
- Priority: JP2015-177762 20150909
- Main IPC: G01T3/06
- IPC: G01T3/06 ; G01V5/00 ; G01N23/204

Abstract:
A non-destructive inspection device 10 using backscattering of neutrons includes a neutron source 3 that radiates a pulse neutron beam to a surface 1a of an inspection target 1, a neutron detection device 5 that detects scattered neutrons scattered in the inspection target 1 and returned, and a measurement device 7 that measures the detection number of scattered and returned neutrons detected by the neutron detection device 5 and generates detection number data expressing the detection number with respect to time.
Public/Granted literature
- US20180259462A1 NON-DESTRUCTIVE INSPECTION DEVICE AND METHOD Public/Granted day:2018-09-13
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