Invention Grant
- Patent Title: Deterioration detecting apparatus and deterioration detecting method
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Application No.: US15014398Application Date: 2016-02-03
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Publication No.: US10241144B2Publication Date: 2019-03-26
- Inventor: Sho Tamura
- Applicant: FUJITSU TEN LIMITED
- Applicant Address: JP Kobe-shi
- Assignee: FUJITSU TEN LIMITED
- Current Assignee: FUJITSU TEN LIMITED
- Current Assignee Address: JP Kobe-shi
- Agency: Oliff PLC
- Priority: JP2015-039510 20150227
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R35/00 ; G01R31/00 ; G01R27/02 ; G01R31/36

Abstract:
A deterioration detecting apparatus includes: a capacitor that is connected to an electric power source through a connection switch; a deterioration detection switch that is provided between the electric power source and a ground point; a charging-path forming unit that controls the connection switch and the deterioration detection switch, such that the electric power source, the capacitor, and the ground point are connected, to form a charging path for charging the capacitor; a voltage detecting unit that detects a voltage of the capacitor charged through the charging path; and a deterioration detecting unit that detects a deterioration in elements such as the capacitor positioned on the charging path, on the basis of the voltage of the capacitor detected by the voltage detecting unit.
Public/Granted literature
- US20160252559A1 DETERIORATION DETECTING APPARATUS AND DETERIORATION DETECTING METHOD Public/Granted day:2016-09-01
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