Presented embodiments facilitate efficient and effective access to a device under test. In one embodiment, a test system comprises: a device interface board (DIB) configured to interface with a device under test (DUT); and a primitive configured to control the device interface board and testing of the device under test. The primitive is an independent self contained test control unit comprising: a backplane interface configured to couple with the device interface board; a power supply component configured to control power to the backplane interface; and a site module configured to control testing signals sent to the device interface board and device under test. The site module is reconfigurable for different test protocols. The primitive can be compatible with a distributed testing infrastructure. In one exemplary implementation, the primitive and device interface board are portable an operable to perform independent testing unfettered by other control components.