An electronic device includes a power switch having a control terminal coupled to a first node, a first conduction terminal coupled to a second node, and a second conduction terminal coupled to a third node. A monitoring circuit has a first input coupled to the first node and a second input coupled to the second node, the monitoring circuit to generate a monitor signal indicating gate oxide stress on the power switch as a function of first and second voltages received at the first and second inputs thereof. A protection circuit actuates to protect the power switch from the gate oxide stress when the monitor signal indicates the gate oxide stress on the power switch. The monitoring signal is generated based upon a comparison of currents generated based upon the voltages at the first and second node, as well as a current generated based upon a programmable reference voltage.