Provided is a MTF measuring method that is capable of estimating an accurate MTF curve in one measurement. The method is a MTF measuring method for measuring the MTF of a CIS that includes a CMOS sensor, and a lens that directs incident reflected light from a document via a contact glass to the CMOS sensor. A test chart is placed on the contact glass via a transparent plate having a thickness that varies at different locations in the sub scanning direction. Then, the CIS is caused to scan in the sub scanning direction, and in one scan, is caused to measure respective MTF at multiple measurement locations where the thickness of the transparent plate differs.