Invention Grant
- Patent Title: Area abnormality detecting system and area abnormality detecting method
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Application No.: US15336971Application Date: 2016-10-28
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Publication No.: US10247437B2Publication Date: 2019-04-02
- Inventor: Meng-Seng Chen , Tien-Szu Lo , Hsiang-Pin Lee
- Applicant: DELTA ELECTRONICS, INC.
- Applicant Address: TW Taoyuan
- Assignee: DELTA ELECTRONICS, INC.
- Current Assignee: DELTA ELECTRONICS, INC.
- Current Assignee Address: TW Taoyuan
- Agency: Hauptman Ham, LLP
- Priority: TW105101492A 20160119
- Main IPC: G05B21/00
- IPC: G05B21/00 ; G01M1/38 ; G05B13/00 ; G05B15/00 ; G05D23/00 ; F24F11/30 ; G05B15/02 ; F24F110/10 ; F24F110/20 ; F24F110/50 ; F24F110/70 ; F24F120/10 ; F24F11/32

Abstract:
An area abnormality detecting system includes multiple apparatuses, multiple sensors and a detecting server. The system is adopted in a space, which is segmented into several blocks with same size. Multiple areas of the space are defined by the blocks separately. The apparatuses are respectively corresponding to each area for providing environmental improving services. The sensors are respectively corresponding to each area for sensing indoor environment of each area. After an abnormality occurs, the detecting server determines an abnormal area and an occurring time corresponding to the abnormality, and obtains apparatus parameters of apparatuses corresponding to the abnormal area that are recorded at the occurring time, so as to determine the occurring reason for the abnormality based on the apparatus parameters.
Public/Granted literature
- US20170205106A1 AREA ABNORMALITY DETECTING SYSTEM AND AREA ABNORMALITY DETECTING METHOD Public/Granted day:2017-07-20
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