Invention Grant
- Patent Title: Shape measurement apparatus and shape measurement method
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Application No.: US15559681Application Date: 2016-12-20
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Publication No.: US10247544B2Publication Date: 2019-04-02
- Inventor: Atsuhiro Hibi , Yusuke Konno , Toshio Akagi , Nobuhiro Furuya , Tomohiro Kuroiwa , Akihito Nakazaki
- Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Current Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2016-126592 20160627
- International Application: PCT/JP2016/087904 WO 20161220
- International Announcement: WO2018/003144 WO 20180104
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/30

Abstract:
[Object] To provide a shape measurement apparatus that is capable of measuring the amount of warpage in the width direction of a strip-shaped body with higher sensitivity.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light at a prescribed angle of incidence; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire the amount of warpage in a width direction of the strip-shaped body on the basis of a line length of the reflected light of the linear light imaged by the imaging unit.
Public/Granted literature
- US20180283850A1 SHAPE MEASUREMENT APPARATUS AND SHAPE MEASUREMENT METHOD Public/Granted day:2018-10-04
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