Invention Grant
- Patent Title: Measuring depth of a surface of a test object
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Application No.: US15303300Application Date: 2015-03-25
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Publication No.: US10247548B2Publication Date: 2019-04-02
- Inventor: Peter Rentschler , Anton Schick
- Applicant: Siemens Aktiengesellschaft
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Slayden Grubert Beard PLLC
- Priority: DE102014207022 20140411
- International Application: PCT/EP2015/056322 WO 20150325
- International Announcement: WO2015/155000 WO 20151015
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01B11/22

Abstract:
A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern.
Public/Granted literature
- US20170030710A1 Measuring Depth Of A Surface Of A Test Object Public/Granted day:2017-02-02
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