Invention Grant
- Patent Title: Method and system for verifying measured data
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Application No.: US15374055Application Date: 2016-12-09
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Publication No.: US10247576B2Publication Date: 2019-04-02
- Inventor: Dirk Heide , Nico Steinhardt
- Applicant: Conti Temic microelectronic GmbH
- Applicant Address: DE Frankfurt
- Assignee: ContinentalTevesAG & Co. oHG
- Current Assignee: ContinentalTevesAG & Co. oHG
- Current Assignee Address: DE Frankfurt
- Priority: DE102014211168 20140611
- Main IPC: G01C21/28
- IPC: G01C21/28 ; G01D3/08 ; G01D5/244 ; G01D1/16 ; G01C21/16

Abstract:
The disclosure relates to a method for verifying measured data from at least one sensor system. The measured data directly or indirectly describe values of physical quantities The values of indirectly described physical quantities are calculated from the measured data and/or from known physical and/or mathematical relationships. At least three values describing an identical quantity are subjected in pairs to a mutual comparison. In addition, at least two of the at least three values describing an identical quantity are determined independently of one another by at least one sensor system. A third value describing an identical quantity is determined by a basic sensor system. The disclosure further relates to a corresponding system and a use of the system.
Public/Granted literature
- US20170089723A1 METHOD AND SYSTEM FOR VERIFYING MEASURED DATA Public/Granted day:2017-03-30
Information query
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