- Patent Title: Temperature measurement device and temperature measurement method
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Application No.: US15271963Application Date: 2016-09-21
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Publication No.: US10247622B2Publication Date: 2019-04-02
- Inventor: Takahiro Arioka , Kazushi Uno , Takeo Kasajima , Hiroyuki Fukuda
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2015-197557 20151005
- Main IPC: G01K11/32
- IPC: G01K11/32

Abstract:
A temperature measurement device includes: an optical fiber that is arranged along a predetermined path; a light source configured to input a light into the optical fiber; a measurer configured to measure temperature distribution information in an extension direction of the optical fiber based on a back-scattering light from the optical fiber; and a corrector configured to make a filter for reducing a noise component of temperature distribution information measured by the measurer based on a difference of temperature distribution information between two different regions of the optical fiber in which a common temperature distribution is obtained, and correct the temperature distribution information by applying the filter to the temperature distribution information.
Public/Granted literature
- US20170097267A1 TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD Public/Granted day:2017-04-06
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