- Patent Title: Method for immunological measurement using a hapten and antibody binding to the hapten as reference antibody and device for immunological measurement using the reference antibody
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Application No.: US15034323Application Date: 2014-10-31
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Publication No.: US10247739B2Publication Date: 2019-04-02
- Inventor: Sunyoung Park , Jeongryul Kim , Seong Woo Kim , Kum-Joo Shin , Ji-Chul Lee
- Applicant: SK TELECOM CO., LTD.
- Applicant Address: KR Seoul
- Assignee: SK TELECOM CO., LTD.
- Current Assignee: SK TELECOM CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: Lex IP Meister, PLLC
- Priority: KR10-2013-0137770 20131113
- International Application: PCT/KR2014/010356 WO 20141031
- International Announcement: WO2015/072686 WO 20150521
- Main IPC: G01N33/78
- IPC: G01N33/78 ; G01N33/543 ; G01N33/68

Abstract:
The present invention relates to a method for the immunological measurement using a hapten and an antibody binding to the hapten as a reference antibody, and a device for the immunological measurement using the reference antibody. According to the present invention, the method and the device for the immunological measurement can be used in an immunoassay by reflecting surrounding environments, for example, by reflecting a numerical value in a test zone, which is changed by external factors such as temperatures of a sample and a device, an amount and components of an injected sample, variations of the device, and the like, in a reference zone and changing the numerical value in the test zone, and can be useful in minimizing analysis errors due to a low probability of causing a non-specific reaction with a material in the sample.
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