Invention Grant
- Patent Title: Length adjustable arm and MEMS position detection equipment rotation test apparatus
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Application No.: US15486287Application Date: 2017-04-12
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Publication No.: US10247775B2Publication Date: 2019-04-02
- Inventor: An-Sung Wang , Ching-Chang Wong , Yang-Han Lee
- Applicant: LEAP ELECTRONIC CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: LEAP ELECTRONIC CO., LTD.
- Current Assignee: LEAP ELECTRONIC CO., LTD.
- Current Assignee Address: TW New Taipei
- Agent Leong C. Lei
- Main IPC: G01R31/28
- IPC: G01R31/28 ; B65G47/91

Abstract:
A length adjustable arm and MEMS position detection equipment rotation test apparatus includes an extendible section and first and second rotary bodies provided at one end of a rotation device for variation of a feeding position of a first feeding component so that feeding component is capable of conducting various feeding ways. Further, a worktable is provided thereon with at least one rotation section, which has a surface on which a plurality of operation stations is mounted. As such, through circular change made by the rotation section in respect of the locations of the operation stations, an effect of effectively and efficiently burning or testing can be achieved. Further, the operation stations are provided, on a periphery thereof, with a turning section, and the turning section is operable to turn each of the operation stations in order to effectively conduct tests for various MEMS inertial components.
Public/Granted literature
- US20180299505A1 LENGTH ADJUSTABLE ARM AND MEMS POSITION DETECTION EQUIPMENT ROTATION TEST APPARATUS Public/Granted day:2018-10-18
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