Invention Grant
- Patent Title: Structurally assisted functional test and diagnostics for integrated circuits
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Application No.: US15439161Application Date: 2017-02-22
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Publication No.: US10247776B2Publication Date: 2019-04-02
- Inventor: Mary P. Kusko , Franco Motika , Gerard M. Salem
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Margaret McNamara
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/3177 ; G01R31/327

Abstract:
Structurally assisted functional test and diagnostics include executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints. One or more built-in structural test support circuits of the device under test is applied to identify one or more likely causes of a failure identified at the one or more checkpoints. A portion of the functional execution sequence between a plurality of the checkpoints is iteratively invoked to progressively isolate the one or more likely causes of the failure as a most likely failure source in combination with one or more results from the one or more built-in structural test support circuits.
Public/Granted literature
- US20180238962A1 STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATED CIRCUITS Public/Granted day:2018-08-23
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