Invention Grant
- Patent Title: Assembled-battery system, semiconductor circuit, and diagnostic method
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Application No.: US14897154Application Date: 2014-06-11
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Publication No.: US10247785B2Publication Date: 2019-04-02
- Inventor: Naoaki Sugimura , Takaaki Izawa
- Applicant: LAPIS Semiconductor Co., Ltd. , YAZAKI CORPORATION
- Applicant Address: JP Yokohama
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Yokohama
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: JP2013-124054 20130612
- International Application: PCT/JP2014/065504 WO 20140611
- International Announcement: WO2014/200032 WO 20141218
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01R35/00 ; H01M10/48

Abstract:
An assembled-battery system, a semiconductor circuit, and a diagnostic method enables appropriate self-diagnosis of a measuring unit. An output value (A-B) output from an analog-to-digital converter through power-supply lines, a cell-selection switch, and a level shifter is summed with an output value (B-VSS) obtained by a directly input reference voltage B being output from the analog-to-digital converter. When the summed value is considered equal the reference voltage A—the voltage VSS, it is diagnosed that an abnormality such as a breakdown has not occurred.
Public/Granted literature
- US20160131717A1 ASSEMBLED-BATTERY SYSTEM, SEMICONDUCTOR CIRCUIT, AND DIAGNOSTIC METHOD Public/Granted day:2016-05-12
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