Invention Grant
- Patent Title: Extraction of problem diagnostic knowledge from test cases
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Application No.: US15415069Application Date: 2017-01-25
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Publication No.: US10248541B2Publication Date: 2019-04-02
- Inventor: Hariharan Krishna , Arun Ramakrishnan , Rohit Shetty
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Isaac J. Gooshaw
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F8/70 ; G06N5/02

Abstract:
Embodiments of the present invention enable users to extract knowledge from testing scenarios performed during application development, and later employ that knowledge to interpret application usage scenarios to enhance serviceability of applications by expediting identification and solving of problems. In an exemplary embodiment, log data generated during simulation of test cases is analyzed to create one or more rules based on patterns in which one or more log entries appear in the log data. Later, log data may be analyzed to look for a pattern of log entries that matches a pattern-based rule, thereby facilitating faster identification and resolution of the problem.
Public/Granted literature
- US20170132114A1 EXTRACTION OF PROBLEM DIAGNOSTIC KNOWLEDGE FROM TEST CASES Public/Granted day:2017-05-11
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