Invention Grant
- Patent Title: Embedding profile tests into profile driven feedback generated binaries
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Application No.: US15350203Application Date: 2016-11-14
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Publication No.: US10248554B2Publication Date: 2019-04-02
- Inventor: Allan H. Kielstra , Ramy Shahin , David K. Siegwart
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent William Kinnaman
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36 ; G06F8/41

Abstract:
Aspects of the present invention include a method, system and computer program product that embeds collected profiling test case information into a binary file of a computer program and subsequently recompiles the program. The method includes a processor specifying one or more test cases to be embedded into a compiled binary file, wherein the one or more test cases relate to at least a portion of a computer program representing a compilation unit; executing the one or more embedded test cases under the computer program; gathering performance data associated with the computer program as the one or more embedded test cases are executed; recompiling the compilation unit based on the performance data; and linking the computer program based on the performance data.
Public/Granted literature
- US20180137039A1 EMBEDDING PROFILE TESTS INTO PROFILE DRIVEN FEEDBACK GENERATED BINARIES Public/Granted day:2018-05-17
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