An integrated circuit (IC) is disclosed herein for embedded memory testing with storage borrowing. In an example aspect, an integrated circuit includes a functional logic block, a memory block, and test logic. The functional logic block includes multiple storage units and is configured to store functional data in the multiple storage units during a regular operational mode. The test logic is configured to perform a test on the memory block during a testing mode. The test logic is also configured to retain memory test result data in the multiple storage units of the functional logic block during the testing mode.