A semiconductor device is disclosed including semiconductor die formed with functionally redundant main and optional die bond pads. In examples, the optional die bond pad is configured to be optionally redundant to the main die bond pad by forming the optional die bond pad with first and second electrically isolated portions, and electrically interconnecting the main die bond pad with the first portion of the second die bond pad. The second die bond pad may or may not be made redundant to the first die bond pad depending on whether an electrically conductive material is deposited on the first and second portions of the optional die bond pad.