Invention Grant
- Patent Title: Protective capping layer for spalled gallium nitride
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Application No.: US15791739Application Date: 2017-10-24
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Publication No.: US10249792B2Publication Date: 2019-04-02
- Inventor: Stephen W. Bedell , Keith E. Fogel , Paul A. Lauro , Devendra K. Sadana
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L33/32 ; H01L21/02 ; H01L33/00 ; H01L33/44 ; H01L33/06 ; H01L33/12 ; H01L33/36

Abstract:
A method of producing a semiconductor device includes forming a stack including a semiconductor material having a Group III nitride semiconductor material formed on a growth substrate, a protective layer formed over the Group III nitride semiconductor material, and a handle layer and a stressor layer formed over the protective layer. The stack is spalled to separate the growth substrate from the stack.
Public/Granted literature
- US20180047875A1 PROTECTIVE CAPPING LAYER FOR SPALLED GALLIUM NITRIDE Public/Granted day:2018-02-15
Information query
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