Invention Grant
- Patent Title: Automatic device testing
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Application No.: US15654220Application Date: 2017-07-19
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Publication No.: US10250873B2Publication Date: 2019-04-02
- Inventor: Nityanand Sharma , Fijula Kuniyil , Jivko Varlakov , Brian E. Bond , Anush Nair
- Applicant: Verizon Patent and Licensing Inc.
- Applicant Address: US NJ Basking Ridge
- Assignee: Verizon Patent and Licensing Inc.
- Current Assignee: Verizon Patent and Licensing Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: G06F11/27
- IPC: G06F11/27 ; H04H60/32 ; H04N17/00 ; H04N17/04 ; H04N21/4425
Abstract:
A device can receive an indication to perform a test of a capability of the device to receive data. The data can have a threshold data rate. The device can perform an action to cause the device to receive the data from a source of the data at the threshold data rate. The device can monitor a set of metrics related to the data or a performance of the device. The device can perform an analysis of the set of metrics after monitoring the set of metrics. The device can identify a source of an error based on a result of performing the analysis of the set of metrics. The source of the error can be related to the data or the performance of the device. The device can perform another action related to fixing the source of the error.
Public/Granted literature
- US20190028699A1 AUTOMATIC DEVICE TESTING Public/Granted day:2019-01-24
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