Invention Grant
- Patent Title: Fundus analysis device and fundus analysis program
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Application No.: US15032123Application Date: 2014-10-27
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Publication No.: US10251551B2Publication Date: 2019-04-09
- Inventor: Ai Yamakawa , Hisanari Torii , Norimasa Satake , Tetsuya Kano , Ryoichi Aihara
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Gamagori
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Gamagori
- Agency: Oliff PLC
- Priority: JP2013-224302 20131029
- International Application: PCT/JP2014/078477 WO 20141027
- International Announcement: WO2015/064531 WO 20150507
- Main IPC: A61B3/00
- IPC: A61B3/00 ; A61B3/14 ; A61B3/12 ; A61B3/10 ; G06T7/00

Abstract:
A fundus analysis device includes: a first database which stores layer thickness information of fundus relating to a plurality of eyes having respective long ocular axial lengths; a processor; and memory storing non-transitory computer readable instructions, when executed by the processor, causing the fundus analysis device to execute: an acquisition instruction of acquiring a tomographic image of a fundus of an examinee's eye by an optical coherence tomography device; and an analysis processing instruction of acquiring analysis information relating to layer thickness information of the fundus of the examinee's eye by referring to the first database.
Public/Granted literature
- US20160302664A1 FUNDUS ANALYSIS DEVICE AND FUNDUS ANALYSIS PROGRAM Public/Granted day:2016-10-20
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