Invention Grant
- Patent Title: Temperature determination based on emissivity
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Application No.: US15111752Application Date: 2014-05-30
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Publication No.: US10252474B2Publication Date: 2019-04-09
- Inventor: David H. Donovan
- Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: HP Inc. Patent Department
- Priority: WOPCT/EP2014/050841 20140116; WOPCT/US2014/032341 20140331
- International Application: PCT/US2014/040212 WO 20140530
- International Announcement: WO2015/108560 WO 20150723
- Main IPC: B29C67/00
- IPC: B29C67/00 ; G01J5/00 ; G01J1/02 ; B29C64/165 ; B29C64/386 ; B33Y30/00 ; B33Y50/02 ; B29K105/00

Abstract:
An additive manufacturing system may include a controller to determine an emissivity of a portion of a layer of build material based on a measured optical property of the portion, or based on object design data representing a degree of intended solidification of the portion. The controller may be to determine a temperature of the portion based on the determined emissivity and a measured radiation distribution emitted by the portion.
Public/Granted literature
- US20160339642A1 TEMPERATURE DETERMINATION BASED ON EMISSIVITY Public/Granted day:2016-11-24
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