Invention Grant
- Patent Title: Semiconductor substrate manufacturing method
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Application No.: US15114364Application Date: 2014-01-28
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Publication No.: US10253432B2Publication Date: 2019-04-09
- Inventor: Masatomo Shibata , Takehiro Yoshida , Toshio Kitamura , Yukio Abe
- Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED
- Applicant Address: JP Tokyo
- Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- International Application: PCT/JP2014/051806 WO 20140128
- International Announcement: WO2015/114732 WO 20150806
- Main IPC: H01L21/00
- IPC: H01L21/00 ; C30B33/00 ; C30B23/00 ; C30B29/40 ; C30B33/06 ; B28D5/02 ; B28D5/04 ; C30B25/02 ; C30B29/60 ; H01L29/04 ; H01L29/20

Abstract:
A semiconductor substrate manufacturing method includes: epitaxially growing a columnar III nitride semiconductor single crystal on a principal place of a circular substrate; removing a hollow cylindrical region at an outer peripheral edge side of the III nitride semiconductor single crystal to leave a solid columnar region at an inside of the hollow cylindrical region of the III nitride semiconductor single crystal; and slicing the solid columnar region after removing the hollow cylindrical region. The hollow cylindrical region is removed such that the shape of the III nitride semiconductor single crystal is always keeps an axial symmetry that a center axis of the III nitride semiconductor single crystal is defined as a symmetric axis.
Public/Granted literature
- US20170009378A1 SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD Public/Granted day:2017-01-12
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