Invention Grant
- Patent Title: Full-field surface roughness
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Application No.: US14927037Application Date: 2015-10-29
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Publication No.: US10254112B1Publication Date: 2019-04-09
- Inventor: Shanalyn A. Kemme , Adam Jones , George Burns
- Applicant: National Technology & Engineering Solutions of Sandia, LLC
- Applicant Address: US NM Albuquerque
- Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee Address: US NM Albuquerque
- Agency: Medley, Behrens & Lewis, LLC
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G06T5/10

Abstract:
The various embodiments presented herein relate to utilizing light in conjunction with an optical Fourier transform to examine and quantify roughness of a surface. The surface includes a plurality of flaked particles. The surface is illuminated with a light beam, wherein light reflected from the surface passes through an f-theta lens and is collected at a light sensitive array (LSA). The LSA comprises light sensitive pixels. For an arrangement where the flakes are conformal with the surface, a low degree of light scattering occurs at the surface. For a surface comprising tipped and/or tilted flakes, a correlating degree of scattering of the incident light beam occurs. The surface roughness is quantified based upon the distribution of angular reflections of the scattered light represented in an image formed through use of the LSA.
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