A connector inspector includes a microscope assembly, a supporting tray, a main frame, and a fitting tip. The microscope assembly is placed within the supporting tray with a bottom cylindrical protrusion inserted into a base plate of the supporting tray, and the supporting tray is coupled with the main frame with a pair of pivoting joints. The microscope assembly is horizontally biased by a spring and an adjusting knob, set between the main frame and the microscope assembly. The microscope assembly is vertically biased by a spring and an adjusting knob, set between the main frame and the microscope assembly. Thus, the microscope assembly may be swung to shift the imaging axis in two dimensions. The design of enables the inspector to be used with just one hand. See-through windows are formed on the sides of the fitting tip for monitoring the shifting of the imaging axis.