Invention Grant
- Patent Title: Device for detecting analyzed object in specimen and method therefor
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Application No.: US14786225Application Date: 2014-04-04
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Publication No.: US10254232B2Publication Date: 2019-04-09
- Inventor: Seungbum Yoo , Eunkyung Kim , Dong Gyu Lee , Sang Hoon Oh , Mi Jin Sohn
- Applicant: SUGENTECH, INC.
- Applicant Address: KR Daejeon
- Assignee: SUGENTECH, INC.
- Current Assignee: SUGENTECH, INC.
- Current Assignee Address: KR Daejeon
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0044971 20130423; KR10-2014-0039299 20140402
- International Application: PCT/KR2014/002914 WO 20140404
- International Announcement: WO2014/175577 WO 20141030
- Main IPC: G01N21/84
- IPC: G01N21/84 ; G01N21/75 ; G01N33/543

Abstract:
A device for detecting analytes in a sample includes (a) n light source units generating light; (b) a reaction strip including (i) a test area illuminated with light from the light source unit and including a material reacting to the analytes, (ii) a control area illuminated with the light from the light source unit and including a control material, and (iii) a background area illuminated with the light from the light source unit; and (c) at least n+1 light receiving units detecting light emitted from the test area, the control area, and the background area of the reaction strip, respectively.
Public/Granted literature
- US20160084768A1 DEVICE FOR DETECTING ANALYZED OBJECT IN SPECIMEN AND METHOD THEREFOR Public/Granted day:2016-03-24
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