Invention Grant
- Patent Title: Probe card with stress relieving feature
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Application No.: US15512249Application Date: 2015-09-18
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Publication No.: US10254311B2Publication Date: 2019-04-09
- Inventor: John L. Dunklee , William A. Funk
- Applicant: CELADON SYSTEMS, INC.
- Applicant Address: US MN Burnsville
- Assignee: CELADON SYSTEMS, INC.
- Current Assignee: CELADON SYSTEMS, INC.
- Current Assignee Address: US MN Burnsville
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- International Application: PCT/US2015/051052 WO 20150918
- International Announcement: WO2016/044786 WO 20160324
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R1/04 ; G01R1/067 ; G01R31/28

Abstract:
A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
Public/Granted literature
- US10295565B2 Probe card with stress relieving feature Public/Granted day:2019-05-21
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